THE AIM OF THIS PROJECT AND THE OBJECTIVE OF DEVELOPING A SPECTROMETER WITH INNOVATIVE FEATURES, SO AS TO IMPROVE THE ACCURACY OF THE MEASURES CARRIED OUT WITH THE TECHNIQUE OF X-RAY FLUORESCENCE AND THEREBY EXTEND THEIR CHANCES OF USE. THE FLUORESCENCE OF X-RAYS AND A NON-DESTRUCTIVE TECHNIQUE FOR DETERMINING THE CHEMICAL COMPOSITION OF A SAMPLE VIA L? ANALYSIS OF THE FLUORESCENCE SPECTRUM OF THE SAMPLE ITSELF. THE APPLICATIONS OF THIS TECHNIQUE ARE MANIFOLD: ? IN THE FIELD OF METALLURGY, AS A MEANS OF MONITORING THE QUALITY OF THE PRODUCTS; ? DO NOT HAVE A DESTRUCTIVE ANALYSIS OF PRECIOUS METALS IN THE OROR SECTOR; ? IN THE SURFACE TREATMENT SECTOR OF METALS, TO DETERMINE COATING THICKNESS; ? IN THE ENVIRONMENTAL SECTOR, TO SHOW THE PRESENCE OF HEAVY METALS; ? IN THE FIELD OF CULTURAL GOODS, TO PERFORM NON-DESTRUCTIVE ANALYSIS OF WORKS OF ART; HOWEVER, TO THE CURRENT STATE, THE TOOLS PRESENT ON THE EEW