The purpose of this project is the renewal of one of the scanning electron microscopes (SEM), available to the Microscopy Section, by a new scanning electron microscope with field emission equipped with an ion beam (FIB), with working mode in cryo and with microanalysis detector and with a resolution at 30 KV of 3 nanometers. The SEM equipment available to the section is one with more than 25 years and the other with 10 years old. The technological advances of the last years have developed new techniques coupled to the SEM equipment._x000D_ In recent years, technological advances have been developed that have been incorporated into SEM equipment. Among them the FIB technique combined with an SEM opens the door to a new dimension making possible the study of the three-dimensional structure at high resolution reaching a resolution in Z of the order of nanometers by eliminating layers of the sample under the action of the beam of ions. This supposes a huge leap qualitative jump compared to conventional high resolution scanning microscopy.