Acquisition of a scanning electron microscope with ultra-high resolution field emission to replace the JEOL 840 that has been working for 33 years._x000D_ The new equipment must be equipped with a high-brightness conical electron gun and a low-aberration objective lens._x000D_ The adoption of the Schottky electron gun type offers stable analysis with a high current probe. You must have the option to work in a vacuum, allowing work with biological samples or non-conductive samples without treatment up to a pressure of 300 Pa in the chamber._x000D_ Acquisition of all the information with several detectors, including detector of secondary electrons, detector of backscattered electrons and an electron detector for STEM._x000D_ EDX microanalysis system for SEM / STEM._x000D_ It must contain the 3View®2XP accessory (Gatan Inc.) that is incorporated into the field emission scanning electron microscope and that makes it possible to automatically create cross sections of the sample and serial images. The 3D reconstruction of the acquired images allows the detailed analysis of the fine structures in three dimensions._x000D_ There is not a near microscope with characteristics similar to those requested with the vocation of being a support service for research and teaching.