A) >> In the micro and nanometer size range, various techniques of electron microscopy can be used to test the most versatile physical and chemical properties of solids. Our goal is to create a laboratory that provides a world-class service in almost the entire spectrum of diverse electron microscopic techniques. To this end, our task is i) to define the needs of the instruments, ii) to create the necessary conditions for their installation, iii) to install the instruments, to establish the laboratory’s operating order, iv) to make the scientific and R & D potential represented by the laboratory widely known, thereby creating the users of the instruments, and v) continuous training of the professional supply. The tasks (i) and (ii) which are key to the success of the whole project are described below. >> The two basic instruments of the laboratory are a scanning transmission and a “scanning” electron microscope (S/TEM and SEM), accompanied by the necessary sample preparation equipment (ultramicrotomy and ion beam thinning equipment). >> The scanning transmission electron microscope (S/TEM) opens up new perspectives at national level in research requiring material testing. The advantage of the instrument over other methods is that it provides both visual, structural (diffraction) and chemical information about the test substance, from micrometer to atomic resolution. The new S/TEM can be operated at an accelerator voltage between 80 and 200 kV, so it can be used flexibly in various disciplines (while the accelerator voltage is 80-120 kV for material science tasks, 80-120 kV for biological tests). Thanks to developments over the last decade, instruments representing the ‘middle category’ peak are now hybrid: in addition to the traditional transmissive mode, they can be operated in scanning mode based on the movement of the focused beam. The electron beam of the S/TEM equipped with a field emission source is 0.3 nm in diameter, making the instrument suitable for analysis in scanning mode with a subnanometer resolution. The result of the development of recent years is a four-unit detector built into the microscope column, which detects sample-induced X-rays with an order of magnitude greater sensitivity than previously, and thus allows quantitative analysis of lightweight elements (C, N, O) and high-speed battery mapping. The planned configuration also allows for 3D tomography morphological and compositional analysis in the nanometer range. The new S/TEM significantly increases the potential of the University of Pannonia (and other universities and research institutions that will use the laboratory’s services) to apply for basic research and to participate in tenders for access to large-scale laboratories in Europe. >> Another basic instrument of the laboratory, the scanning electron microscope (SEM), equipped with a spatial emission electron source, replaces the old instrument of the PE Materials Engineering Institute, whose component supply and service support has practically ceased. The new SEM is capable of surface morphological and compositional examination of any sample with nanometre resolution, not only in large vacuum but also in environmental conditions (e.g. in the case of biological samples in the native, hydrated state). The microscope is provided with an X-ray microanalyser to determine the elemental composition of micro-scale phases. The microscope also includes a redistributed electrondiffraction detector, which allows, in addition to the identification of crystalline phases, to map the orientation of the crystals, the tissue of the material. With the applied configuration, we get a uniquely complete analytical system, which can be used in industrial material testing, as it is suitable for the determination of composition, particle size and orientation of metals, ceramics, pharmaceuticals and electronic components. >> Ultra-thin (< 0.1 µm) samples are suitable for TEM testing, so sample preparation equipment is an important part of the laboratory. For the preparation of “soft” materials (cells, tissues, nanoparticles embedded in resin), ultramicrotomy and “hard” samples (ceramics, semiconductors, metals, catalysts, minerals) are prepared by the ion beam thinner. Since we intend to use the S/TEM laboratory in the most versatile way possible, it is appropriate to purchase both sample preparation equipment. The ultramicrotome also has a cryo chamber, a sample holder cooled by ion beam thinner liquid nitrogen, which allows preparation of preparations suitable for electron microscopic examination from frozen fixed biological samples (ultramictrotomum) and materials sensitive to ion beam thinning (ion beam thinner). Later, the laboratory can be expanded with the state-of-the-art sample preparation device, the focused ion beam thinning device (FIB). >> Designed Instruments